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The Extract Menu: Extraction and Verification

Xic contains a facility for extracting a netlist from the physical database, and comparing it with the schematic in the electrical database. Xic can recognize devices in the physical layout, extract geometric and electrical data from these devices, and correspondingly update properties of electrical device instances. The netlists extracted from the physical and electrical databases can be compared. This layout vs. schematic (LVS) testing is a useful means of minimizing mask errors.

The Extract Menu contains command buttons for performing extraction and related functions. The commands are summarized in the table below, which provides the internal command name and a brief description.

Extract Menu
Label Name Pop-up Function
Setup excfg Extraction Setup Set up and control extraction
Net Selections exsel Path Selection Control Select groups, nodes, paths
Device Selections dvsel Show/Select Devices Select and highlight devices
Source SPICE sourc Source SPICE File Update from SPICE file
Source Physical exset Source Physical Update electrical from physical
Dump Phys Netlist pnet Dump Phys Netlist Save physical netlist
Dump Elec Netlist enet Dump Elec Netlist Save electrical netlist
Dump LVS lvs Dump LVS Save physical/electrical comparison
Extract C exc Cap Extraction Extract capacitance using Fast[er]Cap
Extract LR exlr LR Extraction Extract L/R using FastHenry

In addition to the commands available from the Extract Menu, the extraction system provides a number of prompt-line commands which provide additional or supplemental capability. These include the !antenna command for testing the antenna effect on wire nets connected to MOS gates, and the !netext command for batch extraction of physical wire nets from a layout.



Subsections
next up previous contents index
Next: Extraction System: Methodology and Up: xicmanual Previous: The Design Rule Parameters   Contents   Index
Stephen R. Whiteley 2017-11-08