The report in the postscript file UFSOI.PARAM_EVAL.ps describes
the process-based methodologies for evaluation of the UFSOI-4.5
NFD and FD model parameters. (The UFSOI-7.5 models can be 
calibrated via the methodologies described, with some adjustments.) 
It is essential that these methodologies be used. Use of more-global 
optimization methods with little link to the device structures can 
lead to nonphysical parameters which invalidate the models. 

-------------------------------------------------
Jerry G. Fossum
Professor
 
SOI Group
Department of Electrical and Computer Engineering
University of Florida
541 New Engineering Building
P.O. Box 116130
Gainesville, FL  32611-6130
 
352-392-4921 (tel)
352-392-8381 (fax)
 
fossum@tec.ufl.edu
http://www.soi.tec.ufl.edu
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